Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)

Investigation of gate pulse induced interface trap behaviours and its relationship with threshold voltage instability in Algan/Gan-On-Si MIS-Hemts

Authors
Bin Dong, Jie Lin, Ning Wang, Lingli Jiang, Zongdai Liu, Kai Cheng, Hongyu Yu
Corresponding Author
Bin Dong
Available Online November 2016.
DOI
https://doi.org/10.2991/aest-16.2016.42How to use a DOI?
Keywords
Algan/Gan-On-Si MIS-Hemts; trap behaviours; threshold voltage instability.
Abstract
By measuring transfer characterises before and after a given number of specific pulse cycles applied on the gate electrode for AlGaN/GaN MIS-HEMTs, the threshold voltage (Vth) instability is investigated. Furthermore, by measuring the change in transient gate capacitance (ΔC) under different pulses, the effect of applied gate pulse on interface traps in AlGaN/GaN MIS-HEMTs is studied. These gate pulse induced states are believed to be responsible for the Vth instability in AlGaN/GaN MIS-HEMTs.
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This is an open access article distributed under the CC BY-NC license.

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Proceedings
2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
Part of series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
978-94-6252-257-2
ISSN
1951-6851
DOI
https://doi.org/10.2991/aest-16.2016.42How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Bin Dong
AU  - Jie Lin
AU  - Ning Wang
AU  - Lingli Jiang
AU  - Zongdai Liu
AU  - Kai Cheng
AU  - Hongyu Yu
PY  - 2016/11
DA  - 2016/11
TI  - Investigation of gate pulse induced interface trap behaviours and its relationship with threshold voltage instability in Algan/Gan-On-Si MIS-Hemts
BT  - 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
PB  - Atlantis Press
SN  - 1951-6851
UR  - https://doi.org/10.2991/aest-16.2016.42
DO  - https://doi.org/10.2991/aest-16.2016.42
ID  - Dong2016/11
ER  -