Proceedings of the Advances in Materials, Machinery, Electrical Engineering (AMMEE 2017)

Multiple Sclerosis Slice Identification by Haar Wavelet Transform and Logistic Regression

Authors
Xueyan Wu, Mason Lopez
Corresponding Author
Xueyan Wu
Available Online June 2017.
DOI
10.2991/ammee-17.2017.10How to use a DOI?
Keywords
multiple sclerosis; slice identification; Haar wavelet transform; logistic regression
Abstract

(Aim) Currently, scholars tend to use computer vision approaches to implement multiple sclerosis (MS) identification. (Method) In this study, we proposed a novel MS slice identification system, based on Haar wavelet transform, principal component analysis, and logistic regression. (Result) Simulation results showed the accuracies of our method using 2-level, 3-level, and 4-level decomposition are 83.25ñ1.62%, 89.72ñ1.18%, and 87.65ñ1.79%, respectively. (Conclusion) Our method with 3-level decomposition achieved the best.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the Advances in Materials, Machinery, Electrical Engineering (AMMEE 2017)
Series
Advances in Engineering Research
Publication Date
June 2017
ISBN
10.2991/ammee-17.2017.10
ISSN
2352-5401
DOI
10.2991/ammee-17.2017.10How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xueyan Wu
AU  - Mason Lopez
PY  - 2017/06
DA  - 2017/06
TI  - Multiple Sclerosis Slice Identification by Haar Wavelet Transform and Logistic Regression
BT  - Proceedings of the Advances in Materials, Machinery, Electrical Engineering (AMMEE 2017)
PB  - Atlantis Press
SP  - 50
EP  - 55
SN  - 2352-5401
UR  - https://doi.org/10.2991/ammee-17.2017.10
DO  - 10.2991/ammee-17.2017.10
ID  - Wu2017/06
ER  -