Proceedings of the 2015 International Power, Electronics and Materials Engineering Conference

Dynamic Voltage/Var Sensitivity Approach for Improving Fault-induced Voltage Delayed Recovery Problems

Authors
Yue Zhang, Xiaoming Li
Corresponding Author
Yue Zhang
Available Online May 2015.
DOI
https://doi.org/10.2991/ipemec-15.2015.17How to use a DOI?
Keywords
key bus Integral mapping; sensitivity factor of dynamic voltage/var; voltage delayed recovery.
Abstract
A dynamic sensitivity method is proposed to evaluate the impact of generators’ reactive power on the recovery of key bus voltage in a system post-fault dynamic duration to improve the problem of delayed recovery voltage. Voltage delayed recovery existed in actual power grid is simulated on Guangdong power grid of 2013 to verify the correctness and effectiveness of the method. It is significant to solve the problems of selecting the plant units involved in the reactive power control for shortening the recovery time of key bus voltage.
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This is an open access article distributed under the CC BY-NC license.

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Proceedings
2015 International Power, Electronics and Materials Engineering Conference
Part of series
Advances in Engineering Research
Publication Date
May 2015
ISBN
978-94-62520-73-8
ISSN
2352-5401
DOI
https://doi.org/10.2991/ipemec-15.2015.17How to use a DOI?
Open Access
This is an open access article distributed under the CC BY-NC license.

Cite this article

TY  - CONF
AU  - Yue Zhang
AU  - Xiaoming Li
PY  - 2015/05
DA  - 2015/05
TI  - Dynamic Voltage/Var Sensitivity Approach for Improving Fault-induced Voltage Delayed Recovery Problems
BT  - 2015 International Power, Electronics and Materials Engineering Conference
PB  - Atlantis Press
SN  - 2352-5401
UR  - https://doi.org/10.2991/ipemec-15.2015.17
DO  - https://doi.org/10.2991/ipemec-15.2015.17
ID  - Zhang2015/05
ER  -