Dynamic Voltage/Var Sensitivity Approach for Improving Fault-induced Voltage Delayed Recovery Problems
Yue Zhang, Xiaoming Li
Available Online May 2015.
- https://doi.org/10.2991/ipemec-15.2015.17How to use a DOI?
- key bus Integral mapping; sensitivity factor of dynamic voltage/var; voltage delayed recovery.
- A dynamic sensitivity method is proposed to evaluate the impact of generators’ reactive power on the recovery of key bus voltage in a system post-fault dynamic duration to improve the problem of delayed recovery voltage. Voltage delayed recovery existed in actual power grid is simulated on Guangdong power grid of 2013 to verify the correctness and effectiveness of the method. It is significant to solve the problems of selecting the plant units involved in the reactive power control for shortening the recovery time of key bus voltage.
- Open Access
- This is an open access article distributed under the CC BY-NC license.
Cite this article
TY - CONF AU - Yue Zhang AU - Xiaoming Li PY - 2015/05 DA - 2015/05 TI - Dynamic Voltage/Var Sensitivity Approach for Improving Fault-induced Voltage Delayed Recovery Problems BT - 2015 International Power, Electronics and Materials Engineering Conference PB - Atlantis Press SP - 86 EP - 90 SN - 2352-5401 UR - https://doi.org/10.2991/ipemec-15.2015.17 DO - https://doi.org/10.2991/ipemec-15.2015.17 ID - Zhang2015/05 ER -